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@MISC{iso9126,
  author = {{International Standards Organisation} ({ISO})},
  title = {{I}nternational {S}tandard {ISO/IEC} 9126. {I}nformation technology:
	{S}oftware product evaluation: {Q}uality characteristics and guidelines
	for their use},
  year = {1991}
}

@ARTICLE{alqutaish-JAS-10,
  author = {{R}afa {E} {A}l-{Q}utaish},
  title = {{Q}uality {M}odels in {S}oftware {E}ngineering {L}iterature: {A}n
	{A}nalytical and {C}omparative {S}tudy,},
  journal = {{J}ournal of {A}merican {S}cience, {M}arsland {P}ress, {M}ichigan,
	{USA},},
  year = {2010},
  volume = {Vol. 6, No. 3},
  pages = {166--175.}
}

@ARTICLE{Avizienis2004,
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	and {C}arl {E}. {L}andwehr},
  title = {{B}asic {C}oncepts and {T}axonomy of {D}ependable and {S}ecure {C}omputing},
  journal = {{IEEE} {T}rans. {D}ependable {S}ec. {C}omput.},
  year = {2004},
  volume = {1},
  pages = {11--33},
  number = {1},
  __markedentry = {[nicolas.guelfi]},
  owner = {nicolas.guelfi},
  timestamp = {2009.12.18}
}

@ARTICLE{DBLP-RSL-BlackW97,
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  title = {{V}erifying {R}esilient {S}oftware},
  year = {1997},
  pages = {262--266},
  booktitle = {{HICSS} (5)}
}

@INPROCEEDINGS{Boehm-ICSE-76,
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  title = {{Q}uantitative {E}valuation of {S}oftware {Q}uality},
  booktitle = {{ICSE}},
  year = {1976},
  pages = {592-605},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@INPROCEEDINGS{Cheng-dagstuhl09,
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  title = {{S}oftware {E}ngineering for {S}elf-{A}daptive {S}ystems: {A} {R}esearch
	{R}oadmap.},
  booktitle = {{S}oftware {E}ngineering for {S}elf-{A}daptive {S}ystems},
  year = {2009},
  editor = {Betty H. C. Cheng and Rog�rio de Lemos and Holger Giese and Paola
	Inverardi and Jeff Magee},
  volume = {5525},
  series = {Lecture Notes in Computer Science},
  pages = {1-26},
  publisher = {Springer}
}

@INPROCEEDINGS{Chulani-SMS-03,
  author = {{C}hulani, {S}. and {R}ay, {B}. and {S}anthanam, {P}. and {L}eszkowicz,
	{R}.},
  title = {{M}etrics for managing customer view of software quality},
  year = {2003},
  pages = { 189 - 198},
  month = {sep.},
  journal = {{S}oftware {M}etrics {S}ymposium, 2003. {P}roceedings. {N}inth {I}nternational}
}

@ARTICLE{DBLP-resilience-Dearnley76,
  author = {{P}. {A}. {D}earnley},
  title = {{A}n {I}nvestigation {I}nto {D}atabase {R}esilience},
  journal = {{C}omput. {J}.},
  year = {1976},
  volume = {19},
  pages = {117--121},
  number = {2},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@ARTICLE{Fenton-TSE-94,
  author = {{F}enton, {N}.},
  title = {{S}oftware measurement: a necessary scientific basis},
  journal = {{S}oftware {E}ngineering, {IEEE} {T}ransactions on},
  year = {1994},
  volume = {20},
  pages = {199--206},
  number = {3},
  month = {mar.}
}

@BOOK{fentonL96,
  title = {{S}oftware {M}etrics: {A} {R}igorous and {P}ractical {A}pproach},
  publisher = {International Thompson Computer Press},
  year = {1996},
  author = {{N}orman {E}. {F}enton and {S}hari {L}awrence {P}fleeger}
}

@ARTICLE{Garcia-IST-06,
  author = {{F}{\'e}lix {G}arcia and {M}anuel {F}. {B}ertoa and {C}oral {C}alero
	and {A}ntonio {V}allecillo and {F}rancisco {R}u{\'i}z and {M}ario
	{P}iattini and {M}arcela {G}enero},
  title = {{T}owards a consistent terminology for software measurement},
  journal = {{I}nformation and {S}oftware {T}echnology},
  year = {2006},
  volume = {48},
  pages = {631--644},
  number = {8}
}

@ARTICLE{heck-SQC-10,
  author = {{H}eck, {P}etra and {K}labbers, {M}artijn and {E}ekelen, {M}arko},
  title = {{A} software product certification model},
  journal = {{S}oftware {Q}uality {C}ontrol},
  year = {2010},
  volume = {18},
  pages = {37--55},
  number = {1},
  address = {Hingham, MA, USA},
  publisher = {Kluwer Academic Publishers}
}

@BOOK{Kan-MMSQE-02,
  title = {{M}etrics and {M}odels in {S}oftware {Q}uality {E}ngineering},
  publisher = {Addison-Wesley Longman Publishing Co., Inc.},
  year = {2002},
  author = {{K}an, {S}tephen {H}.}
}

@ARTICLE{kanoun-ASE-01,
  author = {{K}anoun, {K}arama},
  title = {{A} {M}easurement-{B}ased {F}ramework for {S}oftware {R}eliability
	{I}mprovement},
  journal = {{A}nnals of {S}oftware {E}ngineering},
  year = {2001},
  volume = {11},
  pages = {89--106},
  publisher = {Springer Netherlands}
}

@BOOK{Kelvin-PLAA-1889,
  title = { {P}opular lectures and addresses [microform] / by {S}ir {W}illiam
	{T}homson },
  publisher = { Macmillan, London ; New York },
  year = { 1889 },
  author = { {K}elvin, {W}illiam {T}homson, },
  pages = { 3 v. : },
  type = { Book, Microform }
}

@INPROCEEDINGS{Laprie-DSN-08,
  author = {{J}ean-{C}laude {L}aprie},
  title = {{F}rom dependability to resilience},
  booktitle = {{P}roceedings of the {IEEE}/{IFIP} {I}nternational {C}onference on
	{D}ependable {S}ystems and {N}etworks, {DSN} - {F}ast {A}bstracts},
  year = {2008},
  publisher = {IEEE/IFIP}
}

@ARTICLE{DBLP-RSL-MostertS95,
  author = {{M}ostert, {D}. {N}. {J}. and von {S}olms, {S}. {H}.},
  title = {{A} technique to include computer security, safety, and resilience
	requirements as part of the requirements specification},
  journal = {{J}. {S}yst. {S}oftw.},
  year = {1995},
  volume = {31},
  pages = {45--53},
  number = {1},
  address = {New York, NY, USA},
  publisher = {Elsevier Science Inc.}
}

@ARTICLE{Schneidewind-TSE-99,
  author = {{S}chneidewind, {N}.{F}.},
  title = {{M}easuring and evaluating maintenance process using reliability,
	risk, and test metrics},
  journal = {{S}oftware {E}ngineering, {IEEE} {T}ransactions on},
  year = {1999},
  volume = {25},
  pages = {769--781},
  number = {6},
  month = {nov.}
}

@ARTICLE{Schneidewind-COMP-02,
  author = {{N}orman {F}. {S}chneidewind},
  title = {{B}ody of {K}nowledge for {S}oftware {Q}uality {M}easurement},
  journal = {{C}omputer},
  year = {2002},
  volume = {35},
  pages = {77--83},
  address = {Los Alamitos, CA, USA},
  publisher = {IEEE Computer Society}
}

@ARTICLE{Simoncini-PDPS-09,
  author = {{L}uca {S}imoncini},
  title = {{R}esilient computing: {A}n engineering discipline},
  journal = {{P}arallel and {D}istributed {P}rocessing {S}ymposium, {I}nternational},
  year = {2009},
  volume = {0},
  pages = {1},
  address = {Los Alamitos, CA, USA},
  publisher = {IEEE Computer Society}
}

@ARTICLE{DBLP-RSL-Svobodova84,
  author = {{L}iba {S}vobodova},
  title = {{R}esilient {D}istributed {C}omputing},
  journal = {{IEEE} {T}rans. {S}oftware {E}ng.},
  year = {1984},
  volume = {10},
  pages = {257--268},
  number = {3}
}

@ARTICLE{Tian-IEEE-Soft-04,
  author = {{T}ian, {J}.},
  title = {{Q}uality-evaluation models and measurements},
  journal = {{S}oftware, {IEEE}},
  year = {2004},
  volume = {21},
  pages = {84--91},
  number = {3},
  month = {may.}
}

@ARTICLE{Weerahandi-TSE-94,
  author = {{W}eerahandi, {S}. and {H}ausman, {R}.{E}.},
  title = {{S}oftware quality measurement based on fault-detection data},
  journal = {{S}oftware {E}ngineering, {IEEE} {T}ransactions on},
  year = {1994},
  volume = {20},
  pages = {665--676},
  number = {9},
  month = {sep.}
}

